George Emery LYONS Sr. Genealogy
William PATRICK[1]
1860 - 1928 (68 years)-
Name William PATRICK Born 8 May 1860 Orland, Cook, Illinois Gender Male Died 23 Nov 1928 Ericson, Wheeler, Nebraska Person ID I7093 Main Tree Last Modified 15 Nov 2012
Father Fayette S. PATRICK, b. 1830, Pawlet, Rutland, Vermont , d. Feb 1865, Blue Island, Cook, Illinois (Age 35 years) Mother Ruey Keziah CRANDALL, b. 13 Sep 1839, Bremen, Cook, Illinois , d. 13 Aug 1906, Alvin, Vermilion, Illinois (Age 66 years) Married 1857 Blue Island, Cook, Illinois Family ID F848 Group Sheet | Family Chart
Family Nancy Margaret LEMASTERS, b. 25 Mar 1868, Portland, Jay, Indiana , d. 25 Mar 1965, Ord, Valley, Nebraska (Age 97 years) Married 18 Apr 1886 ,Valley, Nebraska Children + 1. Lloyd Howard PATRICK, b. 29 Mar 1887, Ericson, Wheeler, Nebraska , d. 26 Oct 1969, Ericson, Wheeler, Nebraska (Age 82 years) + 2. Fay B. PATRICK, b. 29 Sep 1888, Ericson, Wheeler, Nebraska , d. 15 Oct 1972, Bartlett, Wheeler, Nebraska (Age 84 years) Last Modified 31 Jan 2013 Family ID F2269 Group Sheet | Family Chart
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Event Map = Link to Google Earth Pin Legend : Address : Location : City/Town : County/Shire : State/Province : Country : Not Set
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Sources - [S668] William Patrick - Birth, 1860 US Federal Census of Orland, Cook, Illinois , (U.S.Federal Census Records) (Reliability: 3).
1860 US Federal Census of Orland, Cook, Illinois about Ruey Patrick
In this Census William's father Fayette is listed as Jos Patrick and born in Scotland. Ruey is Fayette's wife and his children are Heman Alexander and William Patrick.
Name: Ruey Patrick
Age in 1860: 20
Birth Year: abt 1840
Birthplace: Illinois
Home in 1860: Orland, Cook, Illinois
Gender: Female
Post Office: Orland
Household Members: Name Age
Jos Patrick: 30,(Fayette S. Patrick) abt 1830, Scotland, (Vermont)
Ruey Patrick: 20, abt 1840, Illinois
Herm A Patrick: 3 abt 1857, Illinois
William Patrick: 2/12, 1860, Illinois
- [S668] William Patrick - Birth, 1860 US Federal Census of Orland, Cook, Illinois , (U.S.Federal Census Records) (Reliability: 3).